An interdisciplinary approach to the evaluation of physical parameters of shallow marine sediments
Missiaen, T.; McGee, T.M.; Pearks, D.; Ollier, G.; Theilen, F. (1996). An interdisciplinary approach to the evaluation of physical parameters of shallow marine sediments, in: De Batist, M. et al. (Ed.) Geology of siliciclastic shelf seas. pp. 299-322
In: De Batist, M.; Jacobs, P. (Ed.) (1996). Geology of siliciclastic shelf seas. Geological Society Special Publication, 117. The Geological Society (London): London. ISBN 1-897799-67-5. 345 pp., more
In: Hartley, A.J. et al. (Ed.) Geological Society Special Publication. Geological Society of London: Oxford; London; Edinburgh; Boston, Mass.; Carlton, Vic.. ISSN 0305-8719; e-ISSN 2041-4927, more
A large number of high-resolution seismic investigations and in situ geotechnical measurements were carried out in the southern Baltic, offshore Bornholm. The geotechnical measurements, carried out with Ifremer's Geotechnical Module and Kiel's GISP system, provided information on cone resistance, induced pore pressure and density of the surficial sediments. The seismic data were subjected to different processing techniques, including detrending and multiple quotient division, which made it possible to deduce the reflection coefficients and impedance contrasts at subbottom interfaces. The different geotechnical and seismic data sets were carefully integrated. There is a good correlation between the in situ results and the interpreted seismic units. Strong variations in geotechnical plots correspond with the reflectors identified on processed seismic sections. The general trend of calculated impedances agrees weIl with the lithological interpretation. However, it would appear that the inversion method does not always result in quantitatively correct values of the sediment parameters. Further development and refining of this method will undoubtedly provide better estimates of the in situ bulk properties of the shallow marine sediments.
All data in the Integrated Marine Information System (IMIS) is subject to the VLIZ privacy policy